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Overview

This competence includes surface topographic and geometric measurements related to the quality control of industrial and custom parts and the evaluation of manufacturing accuracy.

Competencies

  • Two- and three-dimensional surface roughness measurement, analysis of surface topography
  • Examination of the form accuracy of parts
  • Three-dimensional coordinate measurement
  • Measurements with profile projector and conventional devices
  • Examinations with stereomicroscope

Services

  • Two- and three-dimensional surface roughness measurement with mobile and fixed roughness measuring devices, inductive pin, laser or confocal chromatic measuring head, detailed analysis of surface topography with AltiMap software
  • Measurement and analysis of shape and position errors
  • 3D geometric measurements (with CNC coordinate measuring machine)
  • Perform geometric measurements with conventional measuring tools and profile projector
  • Taking stereomicroscopic images, analysing the images, perform measurements

Tools

  • AltiSurf 520 type 3D measuring device for surface topography, AltiMap evaluating software
  • Talyrond 365 shape and position tester with Ultra evaluation software
  • Mitutoyo SJ-310 portable roughness tester
  • Zeiss Stereo Discovery V.8 stereomicroscope with AxioVision evaluation software
  • Mitutoyo PJ-A3000 profile projector, digital measuring instruments
  • Dea Global Classic 050505 3D coordinate measuring machine (Institute of Machine and Product Design)

References

  • VT Plastic Manufacturing Ltd.
    Surface roughness measurement on plastic prism parts
  • BorsodChem cPlc.
    Surface roughness measurement of UK-2870 hydrochloric acid compressor components
  • Robert Bosch Energy and Body Systems Ltd.
    Measuring the depth of scratches on aluminium cover parts
  • Bay Zoltán Applied Research Nonprofit Ltd.
    Optical profilometric tests on anodized aluminium alloy samples

Corporate contact

Zsolt István
Head of Department
C/2
bldg., Entrance 2.
For companies

Webpage of FIEK Research Institute

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